The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Apr. 03, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Nao Nitta, Tokyo, JP;

Shingo Imanishi, Kanagawa, JP;

Taichi Takeuchi, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 21/05 (2006.01); G01N 21/21 (2006.01); G01N 21/53 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01B 21/00 (2013.01); G01N 15/1429 (2013.01); G01N 15/1459 (2013.01); G01N 21/05 (2013.01); G01N 21/21 (2013.01); G01N 21/53 (2013.01); G01N 21/645 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1415 (2013.01);
Abstract

To provide a technique capable of highly accurately measure the intensity and the spectrum of fluorescence and scattered light by effectively correcting measurement error that occurs due to variation of flow positions of fine particles in a channel. A data correction method for a fine particle measurement device is provided, which includes an intensity detection procedure capable of detecting light generated from a fine particle by emitting light onto the fine particle flowing through a channel, and obtaining intensity information about the light, a position detection procedure capable of obtaining position information about the fine particle, and a correction procedure for correcting the intensity information on the basis of the position information.


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