The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Dec. 21, 2016
Applicant:

The United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);

Inventors:

William R. Johnson, Brea, CA (US);

Karl Y. Yee, Pasadena, CA (US);

Simon J. Hook, Pasadena, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01J 5/52 (2006.01);
U.S. Cl.
CPC ...
G01J 5/522 (2013.01);
Abstract

The disclosure is directed to a blackbody calibration target having a textured silicon substrate comprising a base comprising a plurality of needle like structures extending away from the base and having a total emissivity of greater than 99.5% from an electromagnetic radiation source having a wavelength greater than or equal to about 400 nanometers and less than or equal to about 1 mm. The disclosure is further directed to a blackbody calibration target system, and instrument which includes the blackbody calibration target, and a method of calibrating an instrument.


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