The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Jan. 20, 2017
Applicant:
Deere & Company, Moline, IL (US);
Inventors:
Nikolai R. Tevs, Daytona Beach Shores, FL (US);
Terry L. Snipes, East Moline, IL (US);
Elijah B. Garner, Bettendorf, IA (US);
Assignee:
DEERE & COMPANY, Moline, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01F 22/00 (2006.01); G01F 23/00 (2006.01); A01C 15/00 (2006.01); A01D 41/127 (2006.01); G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
G01F 23/2845 (2013.01); A01C 15/006 (2013.01); G01F 22/00 (2013.01); G01F 23/0061 (2013.01); G01F 23/284 (2013.01); A01D 41/1275 (2013.01);
Abstract
A data processor retrieves or accesses a reference bin level versus reference phase for a determined seed type. A measurement device, receiver, or phase measurement module measures an observed phase of a primary received signal. The data processor is adapted to determine an estimated bin level of seeds, where the estimated bin level is established as the reference bin level that corresponds to a respective reference phase that is closest in value to the observed phase.