The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Mar. 04, 2015
Here Global B.v., Veldhoven, NL;
Jane Macfarlane, Oakland, CA (US);
HERE Global B.V., Veldhoven, NL;
Abstract
An approach is provided for classifying probe data into qualitative categories to determine a point of interest. The approach involves processing and/or facilitating a processing of probe data to determine one or more trajectories associated with one or more probes. The approach also involves determining one or more clips of the one or more trajectories associated with one or more locations at which the one or more probes lingered based, at least in part, on at least one space threshold value, at least one time threshold value, or a combination thereof. The approach further involves causing, at least in part, an extraction of one or more probe parameter values from the one or more clips. The approach also involves causing, at least in part, a classification of the one or more probe parameter values into one or more qualitative categories. The approach further involves determining one or more points of interest, one or more characteristics of the one or more points of interest, or a combination thereof associated with the one or more locations based, at least in part, on the one or more qualitative categories.