The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Apr. 20, 2017
Applicant:

Impact Selector International, Llc, Houma, LA (US);

Inventor:

Jason Allen Hradecky, Heath, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 31/107 (2006.01); E21B 47/12 (2012.01); E21B 17/00 (2006.01);
U.S. Cl.
CPC ...
E21B 31/107 (2013.01); E21B 17/003 (2013.01); E21B 47/12 (2013.01);
Abstract

A downhole-adjusting impact apparatus (DAIA) mechanically coupled between opposing first and second portions of a tool string, wherein: the tool string is conveyable within a wellbore extending between a wellsite surface and a subterranean formation; the first tool string portion comprises a first electrical conductor in electrical communication with surface equipment disposed at the wellsite surface; the DAIA comprises a second electrical conductor in electrical communication with the first electrical conductor; and the DAIA is operable to: detect an electrical characteristic of the second electrical conductor; impart a first impact force on the second tool string portion when the electrical characteristic is detected; and impart a second impact force on the second tool string portion when the electrical characteristic is not detected, wherein the second impact force is substantially greater than the first impact force.


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