The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Apr. 14, 2015
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Hans Weber, Menlo Park, CA (US);
Daehyun Yoon, Palo Alto, CA (US);
Valentina Taviani, Palo Alto, CA (US);
Brian A. Hargreaves, Menlo Park, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A method for providing at least one measurement by a magnetic resonance imaging (MRI) system of a tissue property or underlying tissue property in a region sufficiently close to a metal object, so that the metal object induces artifacts is provided. At least one magnetic resonance imaging signal from the region is acquired through the MRI system. The acquired at least one MRI signal is processed to correct for artifacts induced by the metal object. At least one tissue property or underlying tissue property measurement is extracted from the processed at least one MRI signal.