The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Feb. 04, 2015
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Keisuke Yamakawa, Tokyo, JP;
Shinichi Kojima, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
This X-ray CT device uses iterative reconstruction to obtain a CT image with the desired noise reduction or X-ray reduction ratio. An iterative approximation reconstruction unit () is provided which, from measured projection data obtained by an X-ray detection unit of the X-ray CT device, iteratively reconstructs a CT image in a reconstruction range of a subject, and iteratively corrects the CT image such that calculated projection data, calculated through forward projection of a CT image, is the same as the difference between measured projection data detected by the X-raw detection unit and calculated projection data. The iterative approximation reconstruction unit is provided with a parameter determination unit (), an iterative correction unit (), and a table unit () which calculates in advance the relation between each parameter used in the iterative reconstruction, and noise reduction or X-ray reduction ratio in the CT image. The parameter determination unit () determines the parameters from a calculation table in the table unit () depending on the desired reduction ratio.