The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Feb. 18, 2016
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Mary K. Durbin, San Francisco, CA (US);
Shamika Gune, Dublin, CA (US);
Lin An, Walnut Creek, CA (US);
Utkarsh Sharma, Dublin, CA (US);
CARL ZEISS MEDITEC, INC., Dublin, CA (US);
Abstract
Methods and systems in ophthalmic imaging are presented that increase the sensitivity of automated diagnoses by the use of a combination of both functional and structural information derived from a variety of ophthalmic imaging modalities. An example method to analyze image data of an eye of a patient includes processing a first image dataset to obtain one or more functional metrics; processing a second image dataset to obtain one or more structural metrics; comparing the one or more structural metrics to the one or more functional metrics; and processing the results of said comparison to derive the probability of a disease or normality of the eye.