The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Mar. 26, 2018
Applicant:

Cirrus Logic International Semiconductor Ltd., Edinburgh, GB;

Inventors:

John Paul Lesso, Edinburgh, GB;

Emmanuel Philippe Christian Hardy, Edinburgh, GB;

Assignee:

Cirrus Logic, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 3/00 (2006.01); H04R 29/00 (2006.01); G01K 11/26 (2006.01); G10L 25/60 (2013.01); G10L 25/51 (2013.01); G10L 25/18 (2013.01); H04R 19/00 (2006.01);
U.S. Cl.
CPC ...
H04R 29/004 (2013.01); G01K 11/26 (2013.01); G10L 25/18 (2013.01); G10L 25/51 (2013.01); G10L 25/60 (2013.01); H04R 19/005 (2013.01); H04R 2499/11 (2013.01);
Abstract

This application relates to an apparatus () for monitoring an operating temperature condition of a microphone device () having an acoustic port (). The apparatus includes a spectrum peak detect block () for receiving a microphone signal (S) and determining, from the microphone signal, a resonance frequency (f) and a quality factor (Q) of a resonance () associated with the acoustic port of the microphone. A condition monitoring block () is configured to determine any change in resonance frequency and quality factor with respect to respective reference values of resonance frequency and quality factor and to determine a temperature condition for the air temperature within the acoustic port based on said determined changes.


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