The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Dec. 11, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Daisuke Higuchi, Nagareyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/367 (2011.01); H04N 5/369 (2011.01); H04N 5/232 (2006.01); H04N 5/341 (2011.01); H04N 5/3745 (2011.01);
U.S. Cl.
CPC ...
H04N 5/3675 (2013.01); H04N 5/23212 (2013.01); H04N 5/232122 (2018.08); H04N 5/341 (2013.01); H04N 5/3696 (2013.01); H04N 5/36961 (2018.08); H04N 5/37457 (2013.01);
Abstract

In an apparatus, a control unit switches acquisition of a phase difference signal for each area in a sensing device, a correction unit selects defect information associated with a pixel signal acquired from the sensing device and corrects the pixel signal based on the selected defect information, and a memory stores the defect information. The defect information stored in the memory includes at least first defect information and second defect information in the same format as that of the first defect information. The correction unit switches defect information to be used based a change in an area in a frame for which the phase difference signal is to be acquired.


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