The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

May. 18, 2016
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Richard White, Cambridge, GB;

Chris Bower, Cambridge, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H01L 31/115 (2006.01); H01L 31/0352 (2006.01);
U.S. Cl.
CPC ...
H01L 31/115 (2013.01); H01L 27/14609 (2013.01); H01L 27/14659 (2013.01); H01L 27/14696 (2013.01); H01L 31/035218 (2013.01); H01L 31/035227 (2013.01);
Abstract

A device for direct X-ray detection () comprises a plurality of substantially parallel conductive channels () separated from one another by a quantum dot material (), thereby forming a composite material layer (). The parallel conductive channels () are electrically connected to source and drain electrodes () which enable a flow of electrical current through the conductive channels (). The quantum dot material () generates electron hole pairs upon exposure to incident electromagnetic radiation and the thus generated charge results in an electric field which causes a change in electrical current passing through at least one of the conductive channels (). The change in electrical current is indicative of one or more of the presence and magnitude of the incident electromagnetic radiation. Since the conductive channels () are oriented in a direction perpendicular to the plane of the substrate (), the distances between the conductive channels can be chosen under consideration of the diffusion lengths of the generated charge carriers and independently from the thickness of the composite material layer () required for X-ray radiation.


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