The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Oct. 04, 2017
Applicant:

Brewer Science Inc., Rolla, MO (US);

Inventors:

Jinhua Dai, Rolla, MO (US);

Joyce Lowes, Rosebud, MO (US);

Assignee:

Brewer Science, Inc., Rolla, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/027 (2006.01); C08F 120/68 (2006.01); C08F 120/18 (2006.01); H01L 21/02 (2006.01); B05D 1/00 (2006.01); C08L 53/00 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0271 (2013.01); B05D 1/005 (2013.01); C08F 120/18 (2013.01); C08F 120/68 (2013.01); C08L 53/00 (2013.01); G03F 7/0002 (2013.01); H01L 21/02118 (2013.01); H01L 21/02282 (2013.01); H01L 21/02304 (2013.01); H01L 21/02345 (2013.01);
Abstract

The present invention is broadly concerned with materials, processes, and structures that allow an underlayer to be imaged directly using conventional lithography, thus avoiding the photoresist processing steps required by prior art directed self-assembly (DSA) processes. The underlayers can be tailored to favor a selected block of the DSA block co-polymers (BCP), depending on the pattern, and can be formulated either to initially be neutral to the BCP and switch to non-neutral after photoexposure, or can initially be non-neutral to the BCP and switch to neutral after exposure. These materials allow fast crosslinking to achieve solvent resistance and possess good thermal stability.


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