The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Nov. 25, 2016
Applicant:

Empa Eidgenössische Materialprüfungs-und Forschungsanstalt, Dübendorf, CH;

Inventors:

Davide Bleiner, Zürich, CH;

Yunieski Arbelo-Pena, Bern, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/285 (2006.01); H01J 37/244 (2006.01); G01N 23/227 (2018.01); G01R 15/18 (2006.01);
U.S. Cl.
CPC ...
H01J 37/285 (2013.01); G01N 23/227 (2013.01); G01R 15/181 (2013.01); H01J 37/244 (2013.01); H01J 2237/2855 (2013.01);
Abstract

A detector supplement device for integration in a spectroscopy setup with the spectroscopy setup including a vacuum chamber, a light source, a sample irradiating a reflected photon beam and a charged particle beam in the same direction of propagation into a radiation detector which is able to detect ultrafast electric currents originating from charged particles. The detector supplement device includes a Rogowski coil placeable inside the vacuum chamber between the sample and radiation detector. The charged particle beam is guided through the hollow core of the Rogowski coil allowing synchronized measurements of electrical currents due to the charged particle beam correlated to the reflected photon beam, while irradiation of the reflected photon beam and the charged particle beam takes place in the same direction of propagation.


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