The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Sep. 20, 2018
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Nathan Jurgenson, Venice, CA (US);

Linjie Luo, Los Angeles, CA (US);

Jonathan M Rodriguez, II, Los Angeles, CA (US);

Rahul Sheth, Los Angeles, CA (US);

Jia Li, Marina Del Rey, CA (US);

Xutao Lv, Marina Del Rey, CA (US);

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06K 9/00 (2006.01); G06T 7/73 (2017.01); G06F 3/0481 (2013.01); G06F 3/01 (2006.01); G06T 7/246 (2017.01); G06T 19/20 (2011.01); G06T 13/80 (2011.01); G06K 9/78 (2006.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G06T 19/006 (2013.01); G06F 3/012 (2013.01); G06F 3/04815 (2013.01); G06K 9/00624 (2013.01); G06K 9/00664 (2013.01); G06K 9/00671 (2013.01); G06K 9/78 (2013.01); G06T 7/20 (2013.01); G06T 7/246 (2017.01); G06T 7/73 (2017.01); G06T 13/80 (2013.01); G06T 19/20 (2013.01); G06K 2209/21 (2013.01); G06T 2200/04 (2013.01); G06T 2207/30244 (2013.01); G06T 2219/2004 (2013.01);
Abstract

Systems and methods for image based location estimation are described. In one example embodiment, a first positioning system is used to generate a first position estimate. A set of structure façade data describing one or more structure façades associated with the first position estimate is then accessed. A first image of an environment is captured, and a portion of the image is matched to part of the structure façade data. A second position is then estimated based on a comparison of the structure façade data with the portion of the image matched to the structure façade data.


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