The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Oct. 05, 2016
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Masashi Nakao, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/4671 (2013.01); G06K 9/6204 (2013.01); G06T 7/001 (2013.01); G06T 7/74 (2017.01); G06T 2207/10004 (2013.01);
Abstract

A standard image of a product to be a standard for an inspection target is displayed, to set a first region so as to surround a standard pattern in the standard image. Further, a second region for characterizing a position and a posture of the standard pattern is set in the standard image. In a first search step, a feature extracted from the first region set in the standard image is searched from an inspection target image, to roughly obtain the position and the posture of the standard pattern in the inspection target image. In the second search step, the feature extracted from the second region set in the standard image is searched from the inspection target image, to minutely obtain at least one of the position and the posture of the standard pattern in the inspection target image.


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