The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Dec. 15, 2015
Applicant:

Stc.unm, Albuquerque, NM (US);

Inventor:

James Plusquellic, Albuquerque, NM (US);

Assignee:

STC.UNM, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/73 (2013.01); G06F 21/70 (2013.01); G06F 21/60 (2013.01); G06F 21/71 (2013.01); G09C 1/00 (2006.01); H04L 9/32 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 21/73 (2013.01); G06F 21/604 (2013.01); G06F 21/70 (2013.01); G06F 21/71 (2013.01); G09C 1/00 (2013.01); H04L 9/3278 (2013.01); G06F 17/18 (2013.01);
Abstract

A Hardware-Embedded Delay Physical Unclonable Function ('HELP PUF') leverages entropy by monitoring path stability and measuring path delays from core logic macros. Reliability and security enhancing techniques for the HELP PUF reduce bit flip errors during regeneration of the bitstring across environmental variations and improve cryptographic strength along with the corresponding difficulty of carrying out model building attacks. A voltage-based enrollment process screens unstable paths on normally synthesized (glitchy) functional units and reduces bit flip errors by carrying out enrollment at multiple supply voltages controlled using on-chip voltage regulators.


Find Patent Forward Citations

Plusquellic, James. (2019). Reliability enhancement methods for physically unclonable function bitstring generation (U.S. Patent No. 10366253). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10366253

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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