The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Sep. 22, 2015
Applicant:
Sri International, Menlo Park, CA (US);
Inventors:
John Byrnes, Poway, CA (US);
Christina Freyman, Falls Church, VA (US);
Assignee:
SRI International, Menlo Park, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 16/93 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/93 (2019.01);
Abstract
Technology for classifying a data set includes extracting one or more features from items of the data set, computing a specificity measure for the extracted features, and measuring the similarity of the extracted features to a set of characteristic features associated with the property of one or more reference models.
Byrnes, John. (2019). Distributional alignment of sets (U.S. Patent No. 10366108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10366108
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile