The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Jul. 10, 2017
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Osamu Nishii, Kanagawa, JP;

Kiwamu Takada, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/16 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/165 (2013.01); G06F 11/1004 (2013.01); G06F 11/1645 (2013.01); G06F 11/1695 (2013.01); G06F 11/1405 (2013.01);
Abstract

Conventional semiconductor devices are problematic in that an operation cannot be continued in the event of a failure of one of CPU cores performing a lock step operation and, as a result, reliability cannot be improved. The semiconductor device according to the present invention includes a computing unit including a first CPU core and a second CPU core that perform a lock step operation, wherein the first CPU core and the second CPU core respectively diagnose failures of internal logic circuits, and a sequence control circuit switches the CPU core that outputs data to a shared resource, in the computing unit based on the diagnosed result.


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