The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Sep. 18, 2013
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Matthew J. Duftler, Mahopac, NY (US);
Paul T. Keyser, Chicago, IL (US);
Szabolcs Rozsnyai, New York, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G16H 50/70 (2018.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 9/46 (2013.01); G16H 50/70 (2018.01); G06F 11/3452 (2013.01); G06F 2201/86 (2013.01);
Abstract
Systems and methods for data analysis include correlating event data to provide process instances. The process instances are clustered, using a processor, by representing the process instances as strings and determining distances between strings to form a plurality of clusters. One or more metrics are computed on the plurality of clusters to monitor deviation of the event data.