The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Mar. 30, 2017
Futurewei Technologies, Inc., Plano, TX (US);
Jiangsheng Yu, San Jose, CA (US);
Shijun Ma, Milpitas, CA (US);
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
The disclosure relates to technology for generating a data set comprising random numbers that are distributed by a multivariate population distribution. A set of empirical cumulative distribution functions are constructed from a collection of multidimensional random samples of the multivariate population, where each empirical cumulative distribution function is constructed from observations of a random variable. A number of multidimensional sample points are sampled from the collection of multidimensional random samples and the number of multidimensional sample points are each replaced with random neighbors to generate cloned data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile