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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10365352 B1

PDFFull Text
Date of Patent:
Jul. 30, 2019

Filed:

Jun. 02, 2016

Distance measurement instrument with scanning function

Applicant:

Trimble Ab, Danderyd, SE;

Inventors:

Mikael Nordenfelt, Bergshamra, SE;

Mikael Hertzman, Sollentuna, SE;

Assignee:

Trimble AB, Danderyd, SE;

Attorney:

Kilpatrick Townsend & Stockton LLP

Primary Examiner:

Luke D Ratcliffe

Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/481 (2006.01); G01C 15/00 (2006.01); G01S 17/89 (2006.01); G01S 17/42 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01C 15/002 (2013.01); G01S 7/4811 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G02B 26/108 (2013.01);
Abstract

A measurement instrument is disclosed. The measurement instrument comprises a front lens assembly, a distance measurement module and a deflection module. The front lens assembly comprises an optical path along an instrument optical axis and the distance measurement module is configured to transmit and receive optical radiation along a measurement path. The deflection module is arranged between the distance measurement module and the front lens assembly to deflect the measurement path across the instrument optical axis.

Find Patent Forward Citations

Nordenfelt, Mikael. (2019). Distance measurement instrument with scanning function (U.S. Patent No. 10365352). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10365352

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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