The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Apr. 18, 2017
Applicant:

Analog Devices Global, Hamilton, BM;

Inventors:

Edward John Coyne, Athenry, IE;

Alan J. O'Donnell, Castletroy, IE;

Shaun Bradley, Murroe, IE;

David Aherne, Limerick, IE;

David Boland, Limerick, IE;

Thomas G. O'Dwyer, Arlington, MA (US);

Colm Patrick Heffernan, Annacotty, IE;

Kevin B. Manning, Andover, MA (US);

Mark Forde, Nenagh, IE;

David J. Clarke, Patrickswell, IE;

Michael A. Looby, Ballysheedy, IE;

Assignee:

ANALOG DEVICES GLOBAL, Hamilton, BM;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2879 (2013.01); G01R 31/2874 (2013.01);
Abstract

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.


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