The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Oct. 03, 2013
Applicant:
Denka Seiken Co., Ltd., Tokyo, JP;
Inventors:
Ryotaro Mitsumata, Gosen, JP;
Noriyuki Izutani, Gosen, JP;
Assignee:
DENKA SEIKEN CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/569 (2006.01);
U.S. Cl.
CPC ...
G01N 33/56983 (2013.01); G01N 2333/11 (2013.01);
Abstract
Disclosed is a novel method for measuring haemagglutinin of an influenza virus, which can construct an assay system in a shorter period of time than a sandwich immunoassay method using two kinds of anti-haemagglutinin antibodies. The method for measuring haemagglutinin of an influenza virus is achieved by a sandwich immunoassay method comprising sandwiching the haemagglutinin between a lectin which binds to the haemagglutinin but does not bind to an antibody, and an anti-haemagglutinin antibody which undergoes antigen-antibody reaction with the haemagglutinin.