The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Sep. 07, 2016
Applicant:

Fanuc Corporation, Minamitsuru-gun, Yamanashi, JP;

Inventors:

Hajime Ogawa, Yamanashi, JP;

Junichi Tezuka, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01H 3/00 (2006.01); G01M 7/00 (2006.01); G01N 29/04 (2006.01); G01N 29/12 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4454 (2013.01); G01H 3/00 (2013.01); G01M 7/00 (2013.01); G01N 29/04 (2013.01); G01N 29/12 (2013.01); G01N 29/4472 (2013.01);
Abstract

A vibration analysis device calculates a vibration cycle which occurs during a period in which a workpiece is processed by a machine tool, and includes a tangential velocity calculation unit which calculates a velocity in a tangential direction of a movement path of a processing point by using positional information of a drive axis. The vibration analysis device comprises a movement distance calculation unit which calculates a first movement distance of the processing point on the movement path by using the velocity in the tangential direction. The vibration analysis device comprises a vibration cycle calculation unit which calculates a vibration cycle corresponding to streaks on the basis of previously measured streak intervals on the workpiece and the first movement distance of the processing point.


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