The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Nov. 30, 2018
Wuhan Oe-bio Co., Ltd., Wuhan, Hubei, CN;
WUHAN OE-BIO CO., LTD., Wuhan, CN;
Abstract
A method for automatically altering an imaging area in microscopic imaging of a biological sample. In the method, a sample outline is differentiated from surrounding tissues by means of endogenous or exogenous markers; an initial sample imaging area is set; optical microscopic imaging is performed on a sample surface layer, wherein the imaging area is larger than an area to be imaged of the sample; an actual sample area is calculated by an outline identification algorithm using an imaging result of the sample surface layer and is set as an imaging area of next layer; optical microscopic imaging is performed on a sample to be imaged of the next layer according to the set imaging area, wherein the imaging area covers the area to be imaged of the sample and no redundant imaging is performed; and the above steps are repeated until a data acquisition task is completed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile