The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Jun. 06, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Michiel Johannes Jongerius, Eindhoven, NL;

Gerben Kooijman, Eindhoven, NL;

Koray Karakaya, Eindhoven, NL;

Okke Ouweltjes, Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/00 (2006.01); G01N 15/02 (2006.01); G01N 15/06 (2006.01); G01N 15/14 (2006.01); G01N 21/85 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 15/06 (2013.01); G01N 15/1459 (2013.01); G01N 21/85 (2013.01); G01N 21/94 (2013.01); G01N 2015/025 (2013.01); G01N 2015/03 (2013.01); G01N 2015/1402 (2013.01); G01N 2021/8578 (2013.01);
Abstract

An optical particle sensor has at least first and second threshold settings applied to an optical sensor or a sensor signal to obtain first and second optical sensor readings. The first and second optical sensor readings are processed to determine a parameter which is dependent on a type of pollution event. The parameter is used to determine from at least one of the first and second optical sensor readings a mass of all particles below a first particle size. In this way the mass of all particles below a desired size can be evaluated, even though the optical sensor may not be responsive to the smallest particles.


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