The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Jan. 03, 2017
General Electric Company, Schenectady, NY (US);
Andrew David Deal, Niskayuna, NY (US);
Timothy Hanlon, Glenmont, NY (US);
Vipul Kumar Gupta, Guilderland, NY (US);
Erica Elizabeth Sampson, Clifton Park, NY (US);
Justin John Gambone, Jr., Watervliet, NY (US);
Scott Michael Oppenheimer, Schenectady, NY (US);
Laura Cerully Dial, Clifton Park, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An apparatus and method for rapid screening of material properties in a plurality of additively manufactured test specimens. The apparatus includes a build plate having the plurality of additively manufactured test specimens disposed on a first substantially planar surface. The plurality of additively manufactured test specimens are coupled to at least one actuator to one of individually or simultaneously translationally displace each of the test specimens along an axis 'z', and perpendicular to the build plane of the build plate to test material properties of each of the plurality of additively manufactured test specimens. A sensor is coupled to each of the plurality of additively manufactured test specimens. Load vs. displacement data may be used to monitor the progression of monotonic and/or cyclic tests of the plurality of additively manufactured test specimens.