The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Jul. 31, 2017
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;

Inventors:

Tsutomu Hosoi, Nagoya, JP;

Ryotaro Okamoto, Obu, JP;

Takahiro Fukuda, Anjo, JP;

Shinichi Miura, Toyota, JP;

Assignee:

TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota-shi, Aichi-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/20 (2006.01); G01B 5/008 (2006.01); G01M 11/02 (2006.01); G01B 5/252 (2006.01); G01L 5/00 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0038 (2013.01); G01B 11/14 (2013.01);
Abstract

A surface pressure measuring device includes an abutting plate, a lift, a probe, a piezo actuator and a controller. A pinhole is formed in the abutting plate at an abutting surface that abuts a target. The lift causes the target to abut the abutting surface such that the target is compressed to a predetermined thickness. The probe is inserted through the pinhole to be movable in an axial direction of the pinhole. The piezo actuator holds a state in which a tip surface is flush with the abutting surface as the probe resists a repulsive force received from the target while the lift causes the target to abut the abutting surface. The controller calculates a local surface pressure of the target from a load applied to the probe and an area of the tip surface of the probe.


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