The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Jan. 26, 2018
Samsung Electronics Co., Ltd., Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Provided is a spectrum measurement apparatus including a light source configured to emit light to a sample; a light detector configured to receive light, which is reflected or scattered from, or transmitted through the sample, and to measure an intensity of the received light, and a processor configured to reconstruct a spectrum of the sample for calibration while adjusting a value of a spectrum reconstruction parameter in response to the light detector receiving the light and measuring the intensity of the received light, and to determine an optimal value of the spectrum reconstruction parameter based on a similarity between the reconstructed spectrum of the sample for calibration and an original spectrum of the sample for calibration.