The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Feb. 26, 2016
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Hiroyuki Mino, Osaka, JP;

Naotsugu Ueda, Shiga, JP;

Yoshitaka Tsurukame, Shiga, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 21/02 (2006.01);
U.S. Cl.
CPC ...
G01D 21/02 (2013.01);
Abstract

A sensor system has a plurality of sensors and is capable of measuring a plurality of physical quantities. The sensor system includes an operation setting section configured to set operations of the plurality of sensors and an event determining section configured to determine that a prescribed event has occurred when output values of at least a part of the sensors among the plurality of sensors satisfy event conditions corresponding to an occurrence of the prescribed event. When the event determining section determines that the prescribed event has occurred, the operation setting section is configured to change an operational state of a sensor which, among the plurality of sensors, is required to determine an occurrence of an associated event, which is an event that may occur in association with the occurrence of the prescribed event.


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