The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Nov. 20, 2014
Applicant:

Cnh Industrial America Llc, New Holland, PA (US);

Inventors:

Didier Verhaeghe, Ypres, BE;

Tom Coen, Zemst, BE;

Assignee:

CNH Industrial America LLC, New Holland, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/06 (2006.01); A01F 15/08 (2006.01); A01F 15/14 (2006.01); A01F 15/04 (2006.01);
U.S. Cl.
CPC ...
G01B 21/06 (2013.01); A01F 15/042 (2013.01); A01F 15/0825 (2013.01); A01F 15/145 (2013.01);
Abstract

A bale measuring method for a rectangular baler having a bale chamber in which bales are formed. The bale measuring method includes steps of measuring a movement of crop material downstream of the bale chamber as the crop material moves backward in the baler, using the measured movement of the crop material downstream of the bale chamber to calibrate a measurement and calculation tool for measuring a movement of crop material in the bale chamber and for calculating a length of a bale being formed in the bale chamber based on the measurement, and determining the length of the bale being formed in the bale chamber using the calibrated measurement and calculation tool as the bale moves backward in the baler.


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