The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Dec. 18, 2017
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Mikio Watanabe, Saitama, JP;

Fuminori Irie, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); H04N 5/232 (2006.01); G06F 16/00 (2019.01); G01B 11/26 (2006.01); G01N 21/88 (2006.01); G01M 5/00 (2006.01); H04N 5/225 (2006.01); H04N 13/239 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/26 (2013.01); G01M 5/0008 (2013.01); G01M 5/0091 (2013.01); G01N 21/88 (2013.01); G06F 16/00 (2019.01); H04N 5/2252 (2013.01); H04N 5/23203 (2013.01); H04N 5/23229 (2013.01); H04N 5/23293 (2013.01); H04N 5/23299 (2018.08); H04N 13/239 (2018.05); H04N 2013/0081 (2013.01);
Abstract

In an aspect of the invention, first and second images having parallax are acquired by an imaging unit () including a first imaging part (A) and a second imaging part (B), and an angle between an imaging direction of the imaging unit () and a normal direction of a flat surface of an object to be inspected having the flat surface is calculated on the basis of the acquired first and second images. The pan/tilt of the imaging unit () are controlled by a pan/tilt control unit (), but images for inspection showing the object to be inspected are taken and acquired by the imaging unit in a case in which the calculated angle is controlled to an angle within an allowable angle range.


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