The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Oct. 27, 2016
Tianjin University, Tianjin, CN;
Zhenyang Ding, Tianjin, CN;
Di Yang, Tianjin, CN;
Tiegen Liu, Tianjin, CN;
Yang Du, Tianjin, CN;
Zhexi Xu, Tianjin, CN;
Kun Liu, Tianjin, CN;
Junfeng Jiang, Tianjin, CN;
Tianjin University, Tianjin, CN;
Abstract
The present invention discloses a distributed device for simultaneously measuring strain and temperature based on optical frequency domain reflection, comprising a tunable laser, a 1:99 beam splitter, a main interferometer system, a light source phase monitoring system based on an auxiliary interferometer, an acquisition device and a computer processing unit, wherein the main interferometer system comprises two Mach-Zehnder interferometers, and two optical fibers having different cladding diameters are arranged in parallel as sensing fibers. Due to the difference in temperature and strain coefficients of optical fibers of the same diameter, the temperature and strain values during changing the temperature and strain simultaneously can be obtained by matrix operation, thereby achieving an effect of eliminating cross sensitivity of temperature and strain sensing in optical frequency domain reflection.