The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Jul. 18, 2017
Microline Technology Corporation, Traverse City, MI (US);
Bruce I. Girrell, Traverse City, MI (US);
Dean M. Vieau, Traverse City, MI (US);
Johana M. Chirinos, Traverse City, MI (US);
Douglas W. Spencer, Rapid City, MI (US);
QUANTA ASSOCIATES, L.P., Houston, TX (US);
Abstract
A stress mapping system and method is operable to determine and map stresses along a conduit. The system includes a tool movable along a conduit and having at least one sensing device for sensing characteristics of the conduit, and a processor operable to process an output of the at least one sensing device. Responsive to processing of the output by the processor, the processor is operable to determine stresses at a surface of the conduit. Responsive to the processing of the output of the at least one sensing device, and responsive to a determination of a location or position of the tool along the conduit, the system generates a map of determined stresses along the conduit. The map of determined stresses provides a visual representation of the stresses determined at and along the surface of the conduit.