The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Aug. 28, 2017
Applicant:

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Marco Rossi, Usmate Velate, IT;

Sergio Mansueto Reina, Motta Visconti, IT;

Giacomo Calcaterra, Treviolo, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/20 (2006.01); B81C 99/00 (2010.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01); G01M 11/00 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
B81C 99/005 (2013.01); G01M 11/005 (2013.01); G01R 1/067 (2013.01); G01R 1/07307 (2013.01); G01R 31/2886 (2013.01); G01R 31/2889 (2013.01);
Abstract

A probe card fits in a system for testing a micro-electro-mechanical device having an element sensitive to a magnetic field. The probe card is formed by a PCB having a through-opening and probe tips for electrically contacting the micro-electro-mechanical device. A housing structure is received within the through-opening. The housing structure includes a planar peripheral region surrounding seats that protrude and extend at least partly into the through-opening. Magnetic elements are arranged in the seats, with the magnetic elements configured to generate a test magnetic field for testing operation of the micro-electro-mechanical device.


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