The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Mar. 13, 2017
Siemens Healthcare Gmbh, Erlangen, DE;
Peter Bartl, Erlangen, DE;
Martino Leghissa, Wiesenthau, DE;
Marcus Radicke, Veitsbronn, DE;
Sven-Martin Sutter, Herzogenaurach, DE;
Thomas Weber, Hausen, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method and an x-ray apparatus for interferometric 2D x-ray imaging, use a Talbot-Lau interferometer having at least one phase grating and an analysis grating for producing 2D images of an object to be examined using a phase stepping method. A stepwise readout of a detector is carried out continuously at a multiplicity of the phase positions of an interference pattern. Time sequences of readout interval data records which overlap in time are extracted from the readout data records, and at least one result image data record is calculated from an absorption image and/or a phase-contrast image and/or a dark-field image from each readout interval data record.