The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2019
Filed:
Jun. 02, 2017
Hitachi, Ltd., Tokyo, JP;
Kazuma Yokoi, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Base substance thickness projection estimation values () and base substance thickness projection estimation error values () of M (M≤N) base substances are estimated based on measured count projection values () using N energy windows for a subject. The base substance thickness projection estimated values () are updated such that a likelihood in accordance with a joint probability density of all of X-ray projection paths based on the base substance thickness projection estimated error values () increases. The obtained second base substance thickness projection assumed value () is subjected to back projection, thereby obtaining a base substance concentration image estimation value ().