The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Aug. 05, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sangkyu Kim, Yongin-si, KR;

Joonhyung Lee, Yongin-si, KR;

Seongho Cho, Gwacheon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01N 21/23 (2006.01); G01N 21/35 (2014.01); G01N 21/552 (2014.01);
U.S. Cl.
CPC ...
A61B 5/7278 (2013.01); A61B 5/0075 (2013.01); A61B 5/6843 (2013.01); A61B 5/7246 (2013.01); G01N 21/35 (2013.01); G01N 21/552 (2013.01); A61B 2562/12 (2013.01); G01N 2201/1218 (2013.01);
Abstract

Provided are light absorption spectrum correction devices, methods of manufacturing the light absorption spectrum correction devices, and methods of correcting a light absorption spectrum. The light absorption spectrum correction device includes: a light source configured to emit light; an attenuated total reflectance (ATR) crystal layer configured to contact a subject and provide an optical passage along which the light emitted from the light source travels to the subject; a pressure sensor configured to detect a contact pressure applied to the ATR crystal layer by the subject; a spectrum detector and analyzer configured to detect light emitted from the ATR crystal layer, form a light absorption spectrum based on the detected light, and determine an intensity of the light emitted from the ATR crystal layer; and a spectrum correction device configured to correct the light absorption spectrum based on the contact pressure.


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