The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Feb. 15, 2018
Applicant:

Ambarella, Inc., Santa Clara, CA (US);

Inventor:

Elliot N. Linzer, Bergenfield, NY (US);

Assignee:

Ambarella, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); H04N 5/232 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 2207/20024 (2013.01);
Abstract

An apparatus includes a processor circuit and a correction circuit. The processor circuit may be configured to receive a sequence of pictures. The correction circuit may be configured to (i) generate multiple smooth first samples by spatially smoothing multiple first samples selected from a first picture of said sequence of pictures, (ii) generate multiple smooth second samples by spatially smoothing multiple second samples selected from a second picture of said sequence of pictures, (iii) generate multiple adjusted first samples by combining said smooth first samples, said first samples and said smooth second samples, and (iv) generate multiple values based on said second samples and said adjusted first samples. The first samples and the second samples may have different levels of a lighting condition. The adjusted first samples and the second samples may have similar levels of the lighting condition.


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