The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

May. 12, 2015
Applicant:

University of Kwazulu-natal, Durban, ZA;

Inventors:

Marco Mariola, Durban, ZA;

Abdul Rahim Mirza, Durban, ZA;

Francesco Petruccione, Durban, ZA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04L 9/08 (2006.01); G09C 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 9/0852 (2013.01); G09C 1/00 (2013.01);
Abstract

This disclosure relates to a method and system implementing same for identifying and/or measuring an orientation mismatch and/or relative angular velocity between at least two spaced apart stations, the first and second stations having first and second reference frames, respectively, as well as a method and system implementing same for aligning reference frames. The method comprises receiving, at the second station, a reference signal from the first station, the reference signal having a predetermined coding associated with the first reference frame, and splitting the signal into first and second components with respect to the second reference frame by way of an optical device. The method then comprises measuring first and second intensities of the first and second components, and using the measured first and second intensities to determine an approximate angle of deviation, if any, between first and second reference frames. The determined angle may be used to correct the deviation.


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