The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Sep. 07, 2016
Applicant:

Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.o.c., Taoyuan, TW;

Inventors:

Yueh-Mu Lee, Taoyuan, TW;

Chun-Yi Chen, Taoyuan, TW;

Zun-Hao Shih, Taoyuan, TW;

Hwen-Fen Hong, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H01L 31/0304 (2006.01); H01L 31/0687 (2012.01); H01L 27/146 (2006.01); G01N 21/35 (2014.01); G01N 21/64 (2006.01); G06K 9/00 (2006.01); H02S 50/15 (2014.01);
U.S. Cl.
CPC ...
H02S 50/15 (2014.12);
Abstract

The present invention discloses an electrical inspection method for solar cells, comprising steps of supplying a voltage and a current to a solar cell for stimulating the solar cell and giving a ray of light; filtering the light to give a ray of light having a predetermined wavelength; and measuring an optical power value of the light having a predetermined wavelength. The electrical inspection method adopts a low-cost apparatus to replace the solar simulators according to the prior art. In addition to saving costly equipment, filter adjustment, and the maintenance fee for replacing lamps, the defect inspection flow for solar cells can be further integrated and hence improving the efficiency.


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