The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Mar. 10, 2014
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Kazuki Ise, Fuchu, JP;

Yasuhiro Harada, Yokohama, JP;

Hiroki Inagaki, Yokohama, JP;

Norio Takami, Yokohama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/485 (2010.01); H01M 10/48 (2006.01); H01M 4/525 (2010.01); H01M 10/0525 (2010.01); H01M 4/62 (2006.01); H01M 4/36 (2006.01); C01G 33/00 (2006.01); C01G 35/00 (2006.01); C01G 39/00 (2006.01); C01G 49/00 (2006.01); B82Y 30/00 (2011.01);
U.S. Cl.
CPC ...
H01M 4/485 (2013.01); B82Y 30/00 (2013.01); C01G 33/00 (2013.01); C01G 33/006 (2013.01); C01G 35/006 (2013.01); C01G 39/006 (2013.01); C01G 49/0018 (2013.01); H01M 4/366 (2013.01); H01M 4/525 (2013.01); H01M 4/625 (2013.01); H01M 10/0525 (2013.01); H01M 10/482 (2013.01); C01P 2002/72 (2013.01); C01P 2002/74 (2013.01); C01P 2004/61 (2013.01); C01P 2004/62 (2013.01); C01P 2004/64 (2013.01); C01P 2006/12 (2013.01);
Abstract

According to one embodiment, there is provided an active substance. The active substance contains active material particles. The active material particles comprise a compound represented by the formula: TiM1NbM2O. The active material particles has a peak A attributed to a (110) plane which appears at 2θ ranging from 23.74 to 24.14°, a peak B attributed to a (003) plane which appears at 2θ ranging from 25.81 to 26.21° and a peak C attributed to a (02) plane which appears at 2θ ranging from 26.14 to 26.54° in an X-ray diffraction pattern of the active material particles. An intensity Iof the peak A, an intensity Iof the peak B, and an intensity Iof the peak C satisfy the relation (1): 0.80≤I/I≤1.12; and the relation (2) I/I≤0.80.


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