The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Feb. 26, 2016
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Yuhei Umeda, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawsasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); F02D 41/24 (2006.01); F02D 41/14 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); F02D 41/2432 (2013.01); F02D 2041/1433 (2013.01);
Abstract

A non-transitory computer-readable recording medium stores a model generation program that causes a computer to execute a process. The process includes obtaining measurement data on measurement points sequentially measured along a measurement path curve generated from a Hilbert curve laid out in a normalized space in which measurement target ranges of respective plurality of control parameters related to control of an object to be measured are normalized, the measurement points being more in number in a specific area of the measurement target ranges than in an area other than the specific area, and the numbers of measurement points lying on two sides in each group of two adjacent sides of the measurement path curve and where a control parameter changes in opposite directions being balanced; and generating a control model of the object to be measured on the basis of the obtained measurement data of the measurement points.


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