The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Aug. 08, 2016
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Juchang Lee, Seoul, KR;

Chang Gyoo Park, Seoul, KR;

Jaeyun Noh, Seoul, KR;

Sung Heun Wi, Seongnam, KR;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 16/23 (2019.01); G06F 3/06 (2006.01); G06F 3/05 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 3/065 (2013.01); G06F 3/067 (2013.01); G06F 3/0619 (2013.01); G06F 3/0641 (2013.01); G06F 12/0261 (2013.01); G06F 12/0269 (2013.01); G06F 16/2322 (2019.01); G06F 16/2329 (2019.01); G06F 2212/1044 (2013.01); G06F 2212/702 (2013.01);
Abstract

Technologies for performing garbage collection in database systems, such as multi-version concurrency control (MVCC) database systems, are described. For example, different garbage collection techniques can be used separately or in various combinations, including interval garbage collection, group garbage collection, table garbage collection, and combinations. For example, a particular type of combination, called hybrid garbage collection, uses technique from interval garbage collection and group garbage collection, or from interval, group, and table garbage collection.


Find Patent Forward Citations

Lee, Juchang. (2019). Group garbage collection for multi-version concurrency control in database systems (U.S. Patent No. 10360146). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10360146

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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