The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Feb. 25, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Adam K. D'Andrea, Stouffville, CA;

Jenna R. Elliott, Newmarket, CA;

Fahad A. Khan, Milton, CA;

Raymond C. Kwong, Newmarket, CA;

Chad J. McIntyre, Richmond Hill, CA;

Sina Sadeghian Sadeghabad, Kitchener, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/368 (2013.01); G06F 11/3672 (2013.01); G06F 11/3692 (2013.01);
Abstract

In an approach to reducing regression test duration, one or more computer processors receive a first code change. The one or more computer processors retrieve one or more historic code changes relevant to the first code change. The one or more computer processors determine whether one or more failed test cases are relevant to the one or more historic code changes, where the one or more relevant failed test cases and the one or more historic code changes are stored in a table of test history. In response to determining the one or more historic code changes are relevant to one or more failed test cases, the one or more computer processors retrieve the one or more relevant failed test cases from the table of test history.


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