The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Jul. 24, 2017
Emc Ip Holding Company Llc, Hopkinton, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques for identifying I/O workload patterns may include monitoring key performance indicators (KPIs) for a monitoring period; and at the end of the monitoring period, performing processing including: determining whether there have been a specified number of occurrences of a predefined event with respect to a data portion of the application, wherein the predefined event is a violation of an application KPI for the application and also a violation of at least one of a plurality of data storage KPIs for the data portion of the application; and responsive to determining that there have been the specified number of the occurrences of the predefined event with respect to the first data portion of the application, recording a pattern of I/O workload for the data portion in accordance with the occurrences of the predefined event. Hints, such as affecting data movement and/or compression, may be generated based on detected patterns.