The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Feb. 02, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Grant C. Covell, Belmont, MA (US);

David J. Schlegel, Needham, MA (US);

Paul W. Weiss, Boylston, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 11/3414 (2013.01); G06F 11/3419 (2013.01); G06F 11/3466 (2013.01); G06F 2201/865 (2013.01);
Abstract

A method of measuring performance of a computerized system is provided. A test component integrated in a client application module is configured to generate an application specific workflow to be delivered to a computing environment of one or more computing devices for measuring the performance of the computerized system. The integrated test component of the client application module is executed to deliver the application specific workflow to a server system in the computing environment. Performance data is collected based on at least one response received from the computing environment to measure the performance of the computerized system.


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