The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Feb. 07, 2017
Applicant:

Nec Corporation, Minato-ku, Tokyo, JP;

Inventor:

Yukihiro Tanaka, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/16 (2006.01); G06F 11/20 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1629 (2013.01); G06F 11/1608 (2013.01); G06F 11/1616 (2013.01); G06F 11/1637 (2013.01); G06F 11/1654 (2013.01); G06F 11/1662 (2013.01); G06F 11/202 (2013.01); G06F 11/2035 (2013.01); G06F 11/3037 (2013.01);
Abstract

A monitoring device is mounted in each of a plurality of operational systems constituting a fault-tolerant system. The plurality of operational systems have an identical configuration including a processor system. The monitoring device includes a processor. The processor executes instruction to read data from a predetermined storage area in a memory of an accessory device to be monitored, connected to the processor system. The processor further executes instruction to compare the read data with reference data held in advance. The processor further executes instruction to separate the processor system connected to the accessory device to be monitored from the fault-tolerant system when the read data is different from the reference data.


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