Memory controller and data reading method

Abstract

According to one embodiment, a memory controller includes one or more processors configured to function as a writing unit and a reading unit. The writing unit writes data as threshold voltages of individual memory cells. The reading unit reads the written data by detecting threshold voltages of the individual memory cells. The reading unit includes a selecting unit, a detecting unit, and an estimating unit. The selecting unit selects a read-target memory cell. The detecting unit detects a first threshold voltage at a time of reading of the read-target memory cell, and a second threshold voltage at a time of reading of at least one of adjacent memory cells that are adjacent to the read-target memory cell. The estimating unit estimates a third threshold voltage as a threshold voltage at a time of writing in the read-target memory cell based on the first threshold voltage and the second threshold voltage.