The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2019

Filed:

Feb. 20, 2015
Applicant:

Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;

Inventors:

Hiroki Yoshino, Tokyo, JP;

Masato Yamaji, Tokyo, JP;

Naoyuki Fujimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G05B 19/042 (2006.01); G01D 21/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4185 (2013.01); G01D 21/00 (2013.01); G05B 19/0423 (2013.01); Y02P 90/14 (2015.11); Y02P 90/18 (2015.11);
Abstract

A measurement system according to one aspect of the present invention includes a plurality of measurement devices configured to perform measurements at a plurality of sites in a measurement target, respectively, and a measurement management apparatus configured to acquire measured data measured by each of the measurement devices via a communication network. Times timed by the measurement devices are correlated with each other. Each of the measurement devices is configured to transmit the measured data measured based on the correlated time to measurement management apparatus. The measurement management apparatus includes a measured data acquirer configured to acquire the measured data from each of the measurement devices.


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